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Onto Innovation is a worldwide leader in the design, development, manufacture
and support of process control tools that perform macro-defect inspection and
2D/3D optical metrology, lithography systems, and process control analytical
software used by bare silicon wafer manufacturers, semiconductor wafer
fabricators, and advanced packaging manufacturers. Our products are also used
for process control in a number of other high technology markets, including
manufacturing of light emitting diodes ("LED"), vertical-cavity surface-emitting
lasers ("VCSEL"), micro-electromechanical systems ("MEMS"), CMOS image sensors
("CIS"), compound semiconductor (SiC and GaN) power devices, RF filters and
modules, data storage, and certain industrial and scientific applications.
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